International Journal of Advanced Multidisciplinary Research and Studies
Volume 6, Issue 1, 2026
Assessment of Elemental and Structural Properties of Quartz (SiO2) Materials Using X-Ray Fluorescence and X-Ray Diffraction Spectrophotometric Methods
Author(s): Hassan MS, Hassan UF, Garba IH, Mahmoud AA
Abstract:
The aim of the investigation was to carry out assessment of elemental and structural properties of quartz materials using X-ray fluorescence and X-ray diffraction spectrophotometric methods. The objectives of the study were to modify standard analytical methods and to provide analytical/geochemical data which would be a guide to aid future beneficiation of the quartz materials from rocks, particularly for the economic exploration and exploitation of quartz and silicate minerals which had wide range of applications in various industries like solar cells and solar panels, glass, nanoparticles, ceramic and paint industries. The study involved collection of rock samples containing quartz minerals from Kwandonkaya, Magama Gumau and Toro within Toro District of Toro Local Government Area of Bauchi State, Nigeria. The purity analysis of the samples was carried out using X-Ray Fluorescence Spectrophotometric method, while the structural properties was determined using X-Ray Diffraction Spectrophotometric method. The XRF analysis of quartz samples revealed the presence of 68.12 ± 0.08 to 75.63 ± 1.05 % SiO2, 7.34 ± 0.15 to 8.36 ± 9.20 % Al2O3, 1.16 ± 0.09 to 4.33 ± 0.15 % CaO and 0.24 ± 0.06 to 0.60 ± 0.34 % MgO. The quartz materials XRD results showed structural properties such as crystalline size, planes and diffraction angles as well as the associated minerals present such as albite, anorthite, biotite, muscovite and orthoclase.
Keywords: Quartz, Silica, Crystallinity Indices, XRF, FTIR, Beneficiation, Nanoparticles, Solar
Pages: 1888-1893
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